Resolving lateral variations in the frequency dependence of adhesive properties at the surface of a model pressure sensitive adhesive

被引:3
作者
Jia, SJ [1 ]
Foster, MD [1 ]
机构
[1] Univ Akron, Maurice Morton Inst Polymer Sci, Akron, OH 44325 USA
关键词
adhesives; atomic force microscope; mechanical properties; surfaces;
D O I
10.1002/app.10369
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
A commercial scanning probe microscope may be used to laterally resolve qualitative differences in the frequency dependence of material properties at the surface of a model pressure sensitive adhesive (PSA). In a heterogeneous PSA made from polyisoprene and a wood rosin derivative, both the polymer-rich matrix and tackifier-rich domains regions at the surface appear stiffer and show higher adhesive force when increasing the testing frequency from 0.01 to 1 Hz at room temperature. The limited frequency range of the instrument and piezo creep constrain the applicability of the approach. (C) 2002 Jolm Wiley Sons, Inc.
引用
收藏
页码:400 / 404
页数:5
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