Determination of the surface morphology of gold-decahedra nanoparticles using an off-axis electron holography dual-lens imaging system

被引：7

作者：

Cantu-Valle, J. ^{[1
]}

Ruiz-Zepeda, F. ^{[1
]}

Voelkl, E. ^{[2
]}

Kawasaki, M. ^{[3
]}

Santiago, U. ^{[1
]}

Jose-Yacaman, M. ^{[1
]}

Ponce, A. ^{[1
]}

机构：

[1] Univ Texas San Antonio, Dept Phys & Astron, San Antonio, TX 78249 USA

[2] Holowerk LLC, Austin, TX 78732 USA

[3] JEOL USA Inc, Peabody, MA 01960 USA

来源：

MICRON | 2013年 / 54-55卷

基金：

美国国家卫生研究院; 美国国家科学基金会;

关键词：

Electron holography; Dual-lens system; Transmission electron microscopy; Metallic nanoparticles;

D O I：

10.1016/j.micron.2013.07.009

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The purpose of this paper is to show surface irregularities in gold decahedra nanoparticles extracted by using off-axis electron holography in a JEOL ARM 200F microscope. Electron holography has been used in a dual-lens system within the objective lenses: main objective lens and objective minilens. Parameters such as biprism voltage, fringe spacing (sigma), fringe width (W) and optimum fringe contrast have been calibrated. The reliability of the transmission electron microscope performance with these parameters was carried out through a plug-in in the Digital-Micrograph software, which considers the mean inner potential within the particle leading a precise determination of the morphological surface of decahedral nanoparticles obtained from the reconstructed unwrapped phase and image processing. We have also shown that electron holography has the capability to extract information from nanoparticle shape that is currently impossible to obtain with any other electron microscopy technique. Published by Elsevier Ltd.

引用

页码：82 / 86

页数：5

共 4 条

[1] Off-axis electron holography with a dual-lens imaging system and its usefulness in 2-D potential mapping of semiconductor devices
Wang, YY
Kawasaki, M
Bruley, J
Gribelyuk, M
Domenicucci, A
Gaudiello, J
ULTRAMICROSCOPY, 2004, 101 (2-4) : 63 - 72
[2] Calibration for medium resolution off-axis electron holography using a flexible dual-lens imaging system in a JEOL ARM 200F microscope
Cantu-Valle, Jesus
Ruiz-Zepeda, Francisco
Mendoza-Santoyo, Fernando
Jose-Yacaman, Miguel
Ponce, Arturo
ULTRAMICROSCOPY, 2014, 147 : 44 - 50
[3] Determination of Mean Inner Potential and Inelastic Mean Free Path of ZnTe Using Off-Axis Electron Holography and Dynamical Effects Affecting Phase Determination
Gan, Zhaofeng
DiNezza, Michael
Zhang, Yong-Hang
Smith, David J.
McCartney, Martha R.
MICROSCOPY AND MICROANALYSIS, 2015, 21 (06) : 1406 - 1412
[4] Determination of the inelastic mean-free-path and mean inner potential for AlAs and GaAs using off-axis electron holography and convergent beam electron diffraction
Chung, Suk
Smith, David J.
McCartney, Martha R.
MICROSCOPY AND MICROANALYSIS, 2007, 13 (05) : 329 - 335

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