Inhomogeneity of donor doping in SrTiO3 substrates studied by fluorescence-lifetime imaging microscopy

被引：14

作者：

Rodenbuecher, C. ^{[1
,2
]}

Gensch, T. ^{[3
]}

Speier, W. ^{[2
]}

Breuer, U. ^{[4
]}

Pilch, M. ^{[1
,2
,5
]}

Hardtdegen, H. ^{[2
,6
]}

Mikulics, M. ^{[2
,6
]}

Zych, E. ^{[7
]}

Waser, R. ^{[1
,2
,8
]}

Szot, K. ^{[1
,2
,5
]}

机构：

[1] Forschungszentrum Julich, Peter Grunberg Inst PGI 7, D-52425 Julich, Germany

[2] Forschungszentrum Julich, JARA Fundamentals Future Informat Technol, D-52425 Julich, Germany

[3] Forschungszentrum Julich, Inst Complex Syst ICS 4, D-52425 Julich, Germany

[4] Forschungszentrum Julich, Zent Inst Engn Elekt & Analyt ZEA 3, D-52425 Julich, Germany

[5] Univ Silesia, A Chelkowski Inst Phys, PL-40007 Katowice, Poland

[6] Forschungszentrum Julich, Peter Grunberg Inst PGI 9, D-52425 Julich, Germany

[7] Univ Wroclaw, Fac Chem, PL-50383 Wroclaw, Poland

[8] Rhein Westfal TH Aachen, Inst Werkstoffe Elektrotech 2, D-52056 Aachen, Germany

来源：

APPLIED PHYSICS LETTERS | 2013年 / 103卷 / 16期

关键词：

LIGHT-EMISSION;

D O I：

10.1063/1.4825367

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Fluorescence-lifetime imaging microscopy (FLIM) was applied to investigate the donor distribution in SrTiO3 single crystals. On the surfaces of Nb- and La-doped SrTiO3, structures with different fluorescence intensities and lifetimes were found that could be related to different concentrations of Ti3+. Furthermore, the inhomogeneous distribution of donors caused a non-uniform conductivity of the surface, which complicates the production of potential electronic devices by the deposition of oxide thin films on top of doped single crystals. Hence, we propose FLIM as a convenient technique (length scale: 1 mu m) for characterizing the quality of doped oxide surfaces, which could help to identify appropriate substrate materials. (C) 2013 AIP Publishing LLC.

引用

页数：4

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