Acceleration of potential-induced degradation by salt-mist preconditioning in crystalline silicon photovoltaic modules

被引:25
作者
Suzuki, Soh [1 ]
Nishiyama, Naoki [2 ]
Yoshino, Seiji [3 ]
Ujiro, Takumi
Watanabe, Shin [3 ]
Doi, Takuya [4 ]
Masuda, Atsushi [4 ]
Tanahashi, Tadanori [5 ]
机构
[1] ESPEC Corp, Reliabil Testing Headquarters, Tsukuba, Ibaraki 3050035, Japan
[2] JFE Technores Corp, Solut Div, Chiba 2600835, Japan
[3] NPC Inc, Photovolta Business Div, Matsuyama, Ehime 7918044, Japan
[4] Natl Inst Adv Ind Sci & Technol, Res Ctr Photovolta Technol, Tosu, Saga 8410052, Japan
[5] ESPEC Corp, Dev Headquarters, Tsukuba, Ibaraki 3050035, Japan
关键词
STACKING-FAULTS; SOLAR-CELLS;
D O I
10.7567/JJAP.54.08KG08
中图分类号
O59 [应用物理学];
学科分类号
摘要
We examined the sequential effects of salt-mist stress followed by high-system-voltage stress on the power loss of crystalline silicon photovoltaic (PV) modules to determine whether a crucial failure as potential-induced degradation (PID) is accelerated by material-property changes caused by the long-term effects of a less harmful stress such as salt-mist spraying. Degradation profiles confirmed in this study show that PID is accelerated by certain types of salt-mist preconditioning. For the acceleration of PID, the contribution of sodium ions liberated from the front glass of the PV module seems to be excluded. Therefore, we consider that the sodium ions penetrating into the PV modules from the ambient environment may also cause degradation according to the proposed mechanisms of PID, as the sodium ions existing in the front glass cause PID. Furthermore, this type of degradation may indicate the wear-out phenomenon after a long-term exposure in the field (especially near the coast). (C) 2015 The Japan Society of Applied Physics
引用
收藏
页数:12
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