A 300-GHz SPST Switch With a New Coupled-Line Topology in 65-nm CMOS Technology

被引:9
作者
Kim, Jungsoo [1 ]
Kim, Sooyeon [1 ]
Song, Kiryong [1 ]
Rieh, Jae-Sung [1 ]
机构
[1] Korea Univ, Sch Elect Engn, Seoul 02841, South Korea
关键词
CMOS technology; coupled line; single-pole single-throw (SPST); switches; THz; SPDT SWITCHES;
D O I
10.1109/TTHZ.2019.2898815
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A single-pole single-throw (SPST) switch operating around 300 GHz has been developed in this letter based on a 65-nm CMOS technology. The SPST switch adopts a novel coupled-line topology, in which MOSFETs are employed as a variable impedance component at the through-and coupled-ports to achieve a large isolation. Over the measured frequency band of 220-320 GHz, a minimum insertion loss of 3.9 dB (at 303 GHz) and a maximum isolation of 66 dB (at 250 GHz) were obtained. This achieved peak isolation is the largest value obtained so far beyond 100 GHz with a CMOS switch. An isolation larger than 39 dB was maintained for the entire frequency band measured. The measured return loss showed a maximum value of 29 dB at 312 GHz.
引用
收藏
页码:215 / 218
页数:4
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