Direct solution and Monte Carlo simulation of the inverse problem in two-layered half-space

被引：3

作者：

Mertzanides, IC

Goudos, SK

Sahalos, JN ^{[1
]}

机构：

[1] Aristotelian Univ Thessaloniki, Radio Commun Lab, GR-54006 Thessaloniki, Greece

[2] Aristotelian Univ Thessaloniki, Geophys Lab, GR-54006 Thessaloniki, Greece

来源：

ELECTRICAL ENGINEERING | 2002年 / 84卷 / 01期

关键词：

D O I：

10.1007/s002020100081

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A direct method is developed for determining the dielectric properties and thickness of lossy two-layered media. The technique is based on the study of the frequency response of the complex reflection coefficient. The frequency span must contain at least two adjacent extreme values of the real part of the input impedance. Monte Carlo simulations were produced in order to test the accuracy of the method. Applications in hydrology, engineering and environmental geology are discussed.

引用

页码：51 / 60

页数：10

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