Quantum metrology

被引:28
|
作者
Xiang Guo-Yong [1 ]
Guo Guang-Can [1 ]
机构
[1] Univ Sci & Technol China, Key Lab Quantum Informat, Hefei 230026, Peoples R China
基金
中国国家自然科学基金;
关键词
quantum entangled state; phase estimation; quantum imaging; quantum tomography; OPTICAL LITHOGRAPHY; ENTANGLEMENT; TOMOGRAPHY; LIMIT;
D O I
10.1088/1674-1056/22/11/110601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The statistical error is ineluctable in any measurement. Quantum techniques, especially with the development of quantum information, can help us squeeze the statistical error and enhance the precision of measurement. In a quantum system, there are some quantum parameters, such as the quantum state, quantum operator, and quantum dimension, which have no classical counterparts. So quantum metrology deals with not only the traditional parameters, but also the quantum parameters. Quantum metrology includes two important parts: measuring the physical parameters with a precision beating the classical physics limit and measuring the quantum parameters precisely. In this review, we will introduce how quantum characters ( e. g., squeezed state and quantum entanglement) yield a higher precision, what the research areas are scientists most interesting in, and what the development status of quantum metrology and its perspectives are.
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页数:10
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