Anti-reflection coatings for epsilon-near-zero materials

被引:2
作者
Wynne, Laura C. [1 ]
Zhang, Cissy [1 ]
Akpan, Usenobong [1 ]
DI Falco, Andrea [1 ]
Schulz, Sebastian A. [1 ]
机构
[1] Univ St Andrews, Dept Phys & Astron, N Haugh, St Andrews KY16 9SS, Fife, Scotland
基金
英国工程与自然科学研究理事会; 欧洲研究理事会;
关键词
LARGE OPTICAL NONLINEARITY; THIN-FILMS; ANISOTROPY; ALGORITHM;
D O I
10.1364/OME.469382
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Epsilon-near-zero (ENZ) materials have attracted much interest within the photonics community due to the various novel light-matter interactions that can occur in the ENZ regime. These materials display a large impedance mismatch between the ENZ material and free space, making it difficult to couple light into the medium at normal incidence. In this article, we demonstrate that enhanced light coupling into an ENZ metamaterial stack can be achieved via the design and fabrication of anti-reflection coatings, which are simple to fabricate via e-beam evaporation. The coating fabricated has been optimized not only to minimize reflection but also aims to maximize transmission - making these designs applicable to e.g. beam shaping applications. We achieve a transmission enhancement of 20% through our metamaterial over a 150 nm range and reflection minimization of 50% over a 200 nm range.Published by Optica Publishing Group under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
引用
收藏
页码:4088 / 4095
页数:8
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