A cheaper, simpler quantized Hall resistance standard

被引：11

作者：

Inglis, AD ^{[1
]}

机构：

[1] Natl Res Council, Inst Natl Measurement Stand, Ottawa, ON, Canada

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1999年 / 48卷 / 02期

关键词：

quantum Hall effect; resistance measurements; semiconductor devices;

D O I：

10.1109/19.769585

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We have developed an accurate quantized Hall resistance (QHR) standard which is both cheaper and simpler to operate than most of those previously realized. In this paper, we outline the characteristics of the samples used, describe and discuss the design of the dewar and magnet system, and present field sweep data and accurate measurements carried out using a room temperature de current comparator bridge.

引用

页码：289 / 292

页数：4

共 3 条

[1] Fabrication of precision quantized Hall devices [J].

Inglis, AD ;

Minowa, I .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1997, 46 (02) :281-284

[2] INDUSTRIAL EXPERIENCE WITH A QUANTIZED HALL-EFFECT SYSTEM [J].

JAEGER, KB ;

LEVINE, PD ;

ZACK, CA .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1991, 40 (02) :256-261

[3] SOURCES OF UNCERTAINTY IN A DVM-BASED MEASUREMENT SYSTEM FOR A QUANTIZED HALL RESISTANCE STANDARD [J].

LEE, KC ;

CAGE, ME ;

ROWE, PS .

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1994, 99 (03) :227-240

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