Using Crosscorrelation to Mitigate Analog/RF Impairments for Integrated Spectrum Analyzers

被引:18
|
作者
Oude Alink, Mark S. [1 ,2 ]
Klumperink, Eric A. M. [2 ]
Kokkeler, Andre B. J. [1 ]
Ru, Zhiyu [2 ]
Cheng, Wei [2 ]
Nauta, Bram [2 ]
机构
[1] Univ Twente, CAES Grp, CTIT, POB 217, NL-7500 AE Enschede, Netherlands
[2] Univ Twente, IC Design Grp, CTIT, NL-7500 AE Enschede, Netherlands
关键词
Built-in self-test (BIST); cognitive radio; crosscorrelation; dynamic spectrum access; noise reduction; spectrum analyzer (SA); spectrum sensing; CMOS RECEIVER;
D O I
10.1109/TMTT.2012.2235458
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An integrated spectrum analyzer is useful for built-in self-test purposes, software-defined radios, or dynamic spectrum access in cognitive radio. The analog/RF performance is impaired by a number of factors, including thermal noise, phase noise, and nonlinearity. In this paper, we present an integrated circuit with two integrated RF-frontends, of which the outputs are crosscorrelated in digital baseband. We show by theory and measurements that the above-mentioned impairments are mitigated by this technique. The presented 65-nm CMOS prototype operates at 1.2 V, and obtains a noise floor below -169 dBm/Hz, an IIP3 of +25 dBm, and more than 20 dB of phase-noise reduction. In a special high-impedance mode, an even lower noise floor below -172 dBm/Hz is obtained.
引用
收藏
页码:1327 / 1337
页数:11
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