Numerical Analysis of Electron Emission Site Distribution of Carbon Nanofibers for Field Emission Properties

被引:7
作者
Shimoi, Norihiro [1 ]
Tanaka, Shun-ichiro [2 ]
机构
[1] Tohoku Univ, Grad Sch Environm Studies, Aoba Ku, Sendai, Miyagi 9808579, Japan
[2] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
关键词
field emission; carbon nanofiber; electron emission site; surface charge method; NANOTUBES; AREA; ARRAYS; FILMS;
D O I
10.1021/am302324w
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
To obtain optimal field emission (FE) properties, it is important to evaluate FE parameters including the electron emission site alpha and the field enhancement factor beta. However, it is difficult to evaluate alpha quantitatively because the emitting electrons cannot be observed directly. The authors have aimed to analyze this site using an original architecture with a computation system tool based on the surface charge method, and a three-dimensional model has been employed to calculate FE properties with high accuracy. In this study, to analyze alpha for determining FE properties, each carbon nanofiber (CNF) model separated by Cr islands which include the minimum area for calculating electric fields by the surface charge method was constructed on the surface of a Ni catalyst. The FE current was simulated with a Fowler-Nordheim formula using the calculated electric fields, followed by a simulation performed using all CNFs on a field emitter cathode. The electron emission site alpha was determined by comparing the simulation and experimental results of the FE current. It was found that alpha depends on the morphology of the CNF bundles, and a close quantitative correspondence between the experimental and the computation results of FE properties was obtained. In summary, a method of analyzing FE properties was established using an original architecture, making it possible to predict FE properties with a computational tool based on the surface charge method.
引用
收藏
页码:768 / 773
页数:6
相关论文
共 21 条
[1]   Growth of carbon nanotube bundle arrays on silicon surfaces [J].
Bronikowski, Michael J. ;
Manohara, Harish M. ;
Hunt, Brian D. .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2006, 24 (04) :1318-1322
[2]   Electronic properties of the emission sites of low-field emitting diamond films [J].
Frolov, VD ;
Karabutov, AV ;
Pimenov, SM ;
Konov, VI .
DIAMOND AND RELATED MATERIALS, 2000, 9 (3-6) :1196-1200
[3]  
GOMER R, 1961, FIELD EMISSION FIELD, P32
[4]   Prospects and limitations of carbon nanotube field emission electron sources [J].
Gröning, O ;
Clergereaux, R ;
Nilsson, LO ;
Ruffieux, P ;
Gröning, P ;
Schlapbach, L .
CHIMIA, 2002, 56 (10) :553-561
[5]   Observations of electron emission sites on broad area electrodes by an electron emission microscope [J].
Kobayashi, S ;
Saito, Y ;
Mizusawa, T ;
Shirai, K ;
Latham, RV ;
Tajiri, K ;
Yamanaka, Y .
APPLIED SURFACE SCIENCE, 1999, 144-45 :118-122
[6]   Empirical expression for the emission site density of nanotube film emitters [J].
Liu, Huarong ;
Kato, Shigeki ;
Saito, Yahachi .
NANOTECHNOLOGY, 2009, 20 (27)
[7]   Effect of Cathode-Anode Distance on Field Emission Properties for Carbon Nanotube Film Emitters [J].
Liu, Huarong ;
Kato, Shigeki ;
Saito, Yahachi .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2009, 48 (01)
[8]   High-current-density field emitters based on arrays of carbon nanotube bundles [J].
Manohara, HM ;
Bronikowski, MJ ;
Hoenk, M ;
Hunt, BD ;
Siegel, PH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (01) :157-161
[9]   Computer simulation of electric field anaysis for vertically aligned carbon nanotubes (1) - simulation method and computing model [J].
Murata, H ;
Shimoyama, H ;
Ohye, T .
CHARGED PARTICLE DETECTION, DIAGNOSTICS, AND IMAGING, 2001, 4510 :156-162
[10]   Visualization of individual emission sites on flat broad-area field emission cathodes [J].
Nemanic, Vincenc ;
Zumer, Marko ;
Zajec, Bojan .
ULTRAMICROSCOPY, 2008, 108 (02) :69-73