Proton radiation damage experiment on P-Channel CCD for an X-ray CCD camera onboard the ASTRO-H satellite

被引：18

作者：

Mori, Koji ^{[1
]}

Nishioka, Yusuke ^{[1
,2
]}

Ohura, Satoshi ^{[1
]}

Koura, Yoshiaki ^{[1
]}

Yamauchi, Makoto ^{[1
]}

Nakajima, Hiroshi ^{[3
]}

Ueda, Shutaro ^{[3
]}

Kan, Hiroaki ^{[3
]}

Anabuki, Naohisa ^{[3
]}

Nagino, Ryo ^{[3
]}

Hayashida, Kiyoshi ^{[3
]}

Tsunemi, Hiroshi ^{[3
]}

Kohmura, Takayoshi ^{[4
]}

Ikeda, Shoma ^{[4
]}

Murakami, Hiroshi ^{[5
]}

Ozaki, Masanobu ^{[6
]}

Dotani, Tadayasu ^{[6
]}

Maeda, Yukie ^{[7
]}

Sagara, Kenshi ^{[8
]}

机构：

[1] Miyazaki Univ, Dept Appl Phys & Elect Engn, Fac Engn, Miyazaki 8892192, Japan

[2] Miyazaki Univ, Ctr Tech, Fac Engn, Miyazaki 8892192, Japan

[3] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, Toyonaka, Osaka 5600043, Japan

[4] Kogakuin Univ, Dept Phys, Hachioji, Tokyo 1920015, Japan

[5] Rikkyo Univ, Dept Phys, Fac Sci, Toshima Ku, Tokyo 1718501, Japan

[6] Japan Aerosp Explorat Agcy, Inst Space & Astronaut Sci, Chuo Ku, Sagamihara, Kanagawa 2525210, Japan

[7] Miyazaki Univ, Fac Engn, Miyazaki 8892192, Japan

[8] Kyushu Univ, Dept Phys, Higashi Ku, Fukuoka 8128581, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2013年 / 731卷

关键词：

P-channel CCD; Proton radiation damage; Charge-injection; CHARGE-COUPLED-DEVICE; MISSION; SILICON;

D O I：

10.1016/j.nima.2013.05.052

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report on a proton radiation damage experiment on P-channel CCD newly developed for an X-ray CCD camera onboard the ASTRO-H satellite. The device was exposed up to 10(9) protons cm(-2) at 6.7 MeV. The charge transfer inefficiency (CTI) was measured as a function of radiation dose. In comparison with the CTI currently measured in the CCD camera onboard the Suzaku satellite for 6 years, we confirmed that the new type of P-channel CCD is radiation tolerant enough for space use. We also confirmed that a charge-injection technique and lowering the operating temperature efficiently work to reduce the CTI for our device. A comparison with other P-channel CCD experiments is also discussed. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：160 / 165

页数：6

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