Structural and Transport Properties of Two New Heusler Type Ru2VAl and Ru2VGa Compounds

被引：12

作者：

Mondal, Sanchayita ^{[1
]}

Mazumdar, Chandan ^{[1
]}

Ranganathan, R. ^{[1
]}

机构：

[1] Saha Inst Nucl Phys, ECMP Div, Kolkata 700064, India

来源：

SOLID STATE PHYSICS, VOL 57 | 2013年 / 1512卷

关键词：

X-ray diffraction; crystal structure; electrical resistivity;

D O I：

10.1063/1.4791369

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The powder X-ray diffraction (XRD) and resistivity measurements of two new compounds viz. Ru2VAl and Ru2VGa are reported for the first time. The room temperature powder XRD patterns identified these two as Heusler-like compounds (space group Fm-(3)m). The estimated lattice parameters found to be 5.980 angstrom for Ru2VAl and 5.994 angstrom for Ru2VGa. These compounds show high resistances compared to standard metals and have low residual resistivity ratio.

引用

页码：978 / 979

页数：2

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