Electro-Thermal Analysis and Optimisation of Edge Termination of Power Diode Supported by 2-D/3-D Numerical Modelling and Simulation

被引:1
作者
Pribytny, P. [1 ]
Donoval, D. [1 ]
Chvala, A. [1 ]
Marek, J. [1 ]
Molnar, M. [1 ]
机构
[1] Slovak Univ Technol Bratislava, Fac Elect Engn & Informat Technol, Inst Elect & Photon, Bratislava 81219, Slovakia
来源
MICROTHERM' 2013 - MICROTECHNOLOGY AND THERMAL PROBLEMS IN ELECTRONICS | 2014年 / 494卷
关键词
D O I
10.1088/1742-6596/494/1/012003
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Numerical modelling and simulation provide an efficient tool for analysis and optimization of device structure design. In this paper we present the analysis and the geometry optimization of the power module with high power pin diode structure supported by the advanced 2-D/3-D mixed-mode electro-thermal device simulation. The structure under investigation is P+NN+ power diode device designed for high reverse voltages and very high forward currents, with a maximum forward surge current up to 2.7 kA.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] A comparative analysis of 2-D and 3-D simulation for savonius hydrokinetic turbine array
    Chen, Yunrui
    Zhang, Dayu
    Guo, Penghua
    Hu, Qiao
    Li, Jingyin
    [J]. OCEAN ENGINEERING, 2024, 295
  • [23] 3-D THERMAL-CONVECTION PRODUCED BY 2-D THERMAL FORCING
    KELLY, RE
    PAL, D
    [J]. BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (08): : 993 - 993
  • [24] Numerical study of 2-D and 3-D orographic wave drag
    Hereil, P
    Stein, J
    [J]. SEVENTH CONFERENCE ON MESOSCALE PROCESSES, 1996, : 214 - 216
  • [25] 3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs
    Azoui, T.
    Tounsi, P.
    Dupuy, Ph.
    Guillot, L.
    Dorkel, J. M.
    [J]. MICROELECTRONICS RELIABILITY, 2011, 51 (9-11) : 1943 - 1947
  • [26] Efficient Modelling Approach for Transient Coupled Electro-Thermal Simulation on the example of a D2PAK Application
    Schacht, R.
    Rzepka, S.
    [J]. 2017 23RD INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC), 2017,
  • [27] TCAD simulation methodology for full 3-D electro-physical and advanced thermal analysis of power modules
    Pribytny, Patrik
    Chvala, Ales
    Marek, Juraj
    Donoval, Daniel
    [J]. International Conference on Simulation of Semiconductor Processes and Devices, SISPAD, 2017, 2017-September : 249 - 252
  • [28] TCAD Simulation Methodology for Full 3-D Electro-Physical and Advanced Thermal Analysis of Power Modules
    Pribytny, Patrik
    Chvala, Ales
    Marek, Juraj
    Donoval, Daniel
    [J]. 2017 INTERNATIONAL CONFERENCE ON SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES (SISPAD 2017), 2017, : 249 - 252
  • [29] 3-D Thermal Simulation of Power Module Packaging
    Swan, I. R.
    Bryant, A. T.
    Parker-Allotey, N. -A.
    Mawby, P. A.
    [J]. 2009 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION, VOLS 1-6, 2009, : 1185 - 1192
  • [30] 3-D thermal simulation with dynamic power profiles
    Choi, Eunjoo
    Shin, Youngsoo
    [J]. PROCEEDINGS OF 2008 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS 1-10, 2008, : 2765 - 2772