Gate Controlled Diode Characteristics of Super Steep Subthreshold Slope PN-Body Tied SOI-FET for High Efficiency RF Energy Harvesting

被引:0
作者
Momose, Shun [1 ]
Ida, Jiro [1 ]
Mori, Takayuki [1 ]
Yoshida, Takahiro [1 ]
Iwata, Jumpei [1 ]
Horii, Takashi [1 ]
Furuta, Takahiro [1 ]
Itoh, Kenji [1 ]
Ishibashi, Koichiro [2 ]
Arai, Yasuo [3 ]
机构
[1] Kanazawa Inst Technol, Div Elect Engn, 7-1 Ohgigaoka, Nonoichi, Ishikawa 9218501, Japan
[2] Univ Electrocommun, Tokyo, Japan
[3] KEK, High Energy Accelerator Res Org, Tsukuba, Ibaraki, Japan
来源
2017 IEEE SOI-3D-SUBTHRESHOLD MICROELECTRONICS TECHNOLOGY UNIFIED CONFERENCE (S3S) | 2017年
关键词
Steep Subthreshold slope; SOI MOSFET; RF Energy Harvesting;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Gate controlled diode (GCD) characteristics with our newly proposed super steep subthreshold slope (SS) "PN-Body Tied SOI-FET" was shown, for the first time, compared with the conventional diodes. It shows the super steep characteristics, the low leakage current and the sharp On-characteristics even on the ultralow voltage range of 50mV. The simple circuit simulations also indicated that the GCD with "PN-Body Tied SOI-FET" will achieve the high efficiency rectification on the ultralow input power of the RF energy harvesting. Additionally, the slight shift of the voltage of the zero current was confirmed as a specific characteristics on this GCD.
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页数:3
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