Tip-induced artifacts in magnetic force microscopy images

被引：18
|
作者：
Iglesias-Freire, Oscar [1 ]
Bates, Jeffrey R. [2 ]
Miyahara, Yoichi [2 ]
Asenjo, Agustina [1 ]
Gruetter, Peter H. [2 ]
机构：
[1] CSIC, Inst Ciencia Mat Madrid, Madrid 28049, Spain
[2] McGill Univ, Dept Phys, Montreal, PQ H3A 2T8, Canada
来源：
APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 02期
基金：
加拿大自然科学与工程研究理事会;
关键词：
NB FILMS; DOTS;
D O I：
10.1063/1.4776669
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Useful sample information can be extracted from the dissipation in frequency modulation atomic force microscopy due to its correlation to important material properties. It has been recently shown that artifacts can often be observed in the dissipation channel, due to the spurious mechanical resonances of the atomic force microscope instrument when the oscillation frequency of the force sensor changes. In this paper, we present another source of instrumental artifacts specific to magnetic force microscopy (MFM), which is attributed to a magnetization switching happening at the apex of MFM tips. These artifacts can cause a misinterpretation of the domain structure in MFM images of magnetic samples. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4776669]
引用
收藏
页数：4
相关论文
共 50 条
  • [1] TIP-INDUCED MODIFICATIONS IN SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY
    CHO, K
    JOANNOPOULOS, JD
    SCANNING MICROSCOPY, 1995, 9 (02) : 381 - 386
  • [2] TIP ARTIFACTS IN SCANNING FORCE MICROSCOPY
    SCHWARZ, UD
    HAEFKE, H
    REIMANN, P
    GUNTHERODT, HJ
    JOURNAL OF MICROSCOPY-OXFORD, 1994, 173 : 183 - 197
  • [3] Spatial Manipulation and Assembly of Nanoparticles by Atomic Force Microscopy Tip-Induced Dielectrophoresis
    Zhou, Peilin
    Yu, Haibo
    Yang, Wenguang
    Wen, Yangdong
    Wang, Zhidong
    Li, Wen Jung
    Liu, Lianqing
    ACS APPLIED MATERIALS & INTERFACES, 2017, 9 (19) : 16715 - 16724
  • [4] Tip-induced deformation of polystyrene latex reference nanoparticles in atomic force microscopy
    Farkas, Natalia
    Kramar, John A.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2020, 38 (02):
  • [5] Reversible tip-induced structural modifications in scanning tip microscopy
    Cho, KJ
    Jannopoulos, JD
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (6B): : 3714 - 3718
  • [6] Reversible tip-induced structural modifications in scanning tip microscopy
    Cho, Kyeongjae
    Joannopoulos, John D.
    Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes & Review Papers, 1996, 35 (6 B): : 3714 - 3718
  • [7] Nanoscale patterning of an organosilane monolayer on the basis of tip-induced electrochemistry in atomic force microscopy
    Sugimura, H
    Okiguchi, K
    Nakagiri, N
    Miyashita, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (06): : 4140 - 4143
  • [8] Magnetic force microscope tip-induced remagnetization of CoPt nanodisks with perpendicular anisotropy
    Mironov, V. L.
    Gribkov, B. A.
    Vdovichev, S. N.
    Gusev, S. A.
    Fraerman, A. A.
    Ermolaeva, O. L.
    Shubin, A. B.
    Alexeev, A. M.
    Zhdan, P. A.
    Binns, C.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (05)
  • [9] Magnetic force microscope tip-induced remagnetization of CoPt nanodisks with perpendicular anisotropy
    Mironov, V.L.
    Gribkov, B.A.
    Vdovichev, S.N.
    Gusev, S.A.
    Fraerman, A.A.
    Ermolaeva, O.L.
    Shubin, A.B.
    Alexeev, A.M.
    Zhdan, P.A.
    Binns, C.
    Journal of Applied Physics, 2009, 106 (05):
  • [10] Nanoscale patterning of an organosilane monolayer on the basis of tip-induced electrochemistry in atomic force microscopy
    Sugimura, Hiroyuki
    Okiguchi, Keiko
    Nakagiri, Nobuyuki
    Miyashita, Masayuki
    Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena, 1996, 14 (06):
12345