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Interlayer thermal conductance within a phosphorene and graphene bilayer
被引:71
作者:
Hong, Yang
[1
]
Zhang, Jingchao
[2
]
Zeng, Xiao Cheng
[1
]
机构:
[1] Univ Nebraska Lincoln, Dept Chem, Lincoln, NE 68588 USA
[2] Univ Nebraska Lincoln, Holland Comp Ctr, Lincoln, NE 68588 USA
来源:
关键词:
MOLECULAR-DYNAMICS SIMULATIONS;
2-DIMENSIONAL PHOSPHORENE;
BLACK PHOSPHORUS;
NANORIBBONS;
TRANSPORT;
CONDUCTIVITY;
INTERFACE;
CONTACT;
FIELD;
FUNCTIONALIZATION;
D O I:
10.1039/c6nr07977f
中图分类号:
O6 [化学];
学科分类号:
0703 ;
摘要:
Monolayer graphene possesses unusual thermal properties, and is often considered as a prototype system for the study of thermal physics of low-dimensional electronic/thermal materials, despite the absence of a direct bandgap. Another two-dimensional (2D) atomic layered material, phosphorene, is a natural p-type semiconductor and it has attracted growing interest in recent years. When a graphene monolayer is overlaid on phosphorene, the hybrid van der Waals (vdW) bilayer becomes a potential candidate for high-performance thermal/electronic applications, owing to the combination of the direct-bandgap properties of phosphorene with the exceptional thermal properties of graphene. In this work, the interlayer thermal conductance at the phosphorene/graphene interface is systematically investigated using classical molecular dynamics (MD) simulation. The transient pump-probe heating method is employed to compute the interfacial thermal resistance (R) of the bilayer. The predicted R value at the phosphorene/graphene interface is 8.41 x 10(-8) K m(2) W-1 at room temperature. Different external and internal conditions, i.e., temperature, contact pressure, vacancy defect, and chemical functionalization, can all effectively reduce R at the interface. Numerical results of R reduction as a function of temperature, interfacial coupling strength, defect ratio, or hydrogen coverage are reported with the most R reduction amounting to 56.5%, 70.4%, 34.8% and 84.5%, respectively.
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页码:19211 / 19218
页数:8
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