TOF-SIMS studies of yttria-stabilised zirconia

被引：39
|
作者：
Hansen, Karin Vels
Norrman, Kion
Mogensen, Mogens
机构：
[1] Riso Natl Lab, Mat Res Dept, DK-4000 Roskilde, Denmark
[2] Riso Natl Lab, Danish Polymer Ctr, DK-4000 Roskilde, Denmark
来源：
SURFACE AND INTERFACE ANALYSIS | 2006年 / 38卷 / 05期
关键词：
TOF-SIMS; SOFC; segregation; impurities; depth profile; YSZ;
D O I：
10.1002/sia.2314
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The surface of an as-polished and an as-sintered yttria-stabilised zirconia pellet was analysed with XPS and TOF-SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as-polished and as-sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright (C) 2006 John Wiley & Sons, Ltd.
引用
收藏
页码：911 / 916
页数：6
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