The LAMP instrument at the Linac Coherent Light Source free-electron laser

被引：23

作者：

Osipov, Timur ^{[1
,2
,3
]}

Bostedt, Christoph ^{[2
,4
]}

Castagna, J. -C. ^{[2
]}

Ferguson, Ken R. ^{[2
]}

Bucher, Maximilian ^{[2
]}

Montero, Sebastian C. ^{[2
]}

Swiggers, Michele L. ^{[2
]}

Obaid, Razib ^{[3
]}

Rolles, Daniel ^{[5
,6
]}

Rudenko, Artem ^{[5
,6
]}

Bozek, John D. ^{[2
,7
]}

Berrah, Nora ^{[3
]}

机构：

[1] Western Michigan Univ, Phys Dept, Kalamazoo, MI 49008 USA

[2] SLAC Natl Accelerator Lab, LCLS, Menlo Pk, CA 94025 USA

[3] Univ Connecticut, Phys Dept, Storrs, CT 06269 USA

[4] Argonne Natl Lab, Chem Sci & Engn Div, 9700 South Cass Ave, Lemont, IL 60439 USA

[5] DESY, Ctr Free Electron Laser Sci, Notkestr 85, D-22607 Hamburg, Germany

[6] Kansas State Univ, JR Macdonald Lab, Manhattan, KS 66506 USA

[7] Synchrotron SOLEIL, BP 48, F-91192 Gif Sur Yvette, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2018年 / 89卷 / 03期

关键词：

X-RAY LASER; SERIAL FEMTOSECOND CRYSTALLOGRAPHY; PROTEIN NANOCRYSTALLOGRAPHY; MULTIPHOTON IONIZATION; MOMENTUM SPECTROSCOPY; EXTREME-ULTRAVIOLET; RECOIL-ION; DYNAMICS; MOLECULES; PULSES;

D O I：

10.1063/1.5017727

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The Laser Applications in Materials Processing (LAMP) instrument is a new end-station for soft X-ray imaging, high-field physics, and ultrafast X-ray science experiments that is available to users at the Linac Coherent Light Source (LCLS) free-electron laser. While the instrument resides in the Atomic, Molecular and Optical science hutch, its components can be used at any LCLS beamline. The end-station has a modular design that provides high flexibility in order to meet user-defined experimental requirements and specifications. The ultra-high-vacuum environment supports different sample delivery systems, including pulsed and continuous atomic, molecular, and cluster jets; liquid and aerosols jets; and effusive metal vapor beams. It also houses movable, large-format, high-speed pnCCD X-ray detectors for detecting scattered and fluorescent photons. Multiple charged-particle spectrometer options are compatible with the LAMP chamber, including a double-sided spectrometer for simultaneous and even coincident measurements of electrons, ions, and photons produced by the interaction of the high-intensity X-ray beam with the various samples. Here we describe the design and capabilities of the spectrometers along with some general aspects of the LAMP chamber and show some results from the initial instrument commissioning. Published by AIP Publishing.

引用

页数：10

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