Statistics of single-electron signals in electron-multiplying charge-coupled devices

被引：19

作者：

Plakhotnik, T ^{[1
]}

Chennu, A

Zvyagin, AV

机构：

[1] Univ Queensland, Sch Phys Sci, Brisbane, Qld 4072, Australia

[2] Univ Queensland, Sch Phys Sci, Brisbane, Qld 4072, Australia

[3] Univ Queensland, Sch Informat Technol & Elect Engn, Brisbane, Qld 4072, Australia

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2006年 / 53卷 / 04期

关键词：

charge coupled device (CCD); low-light level imaging; noise; photon counting; single-photon detection;

D O I：

10.1109/TED.2006.870572

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Electron-multiplying charge coupled devices promise to revolutionize ultrasensitive optical imaging. The authors present a simple methodology allowing reliable measurement of camera characteristics and statistics of single-electron events, compare the measurements to a simple theoretical model, and report camera performance in a truly photon-counting regime that eliminates the excess noise related to fluctuations of the multiplication gain.

引用

页码：618 / 622

页数：5

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