C- and L-band erbium-doped waveguide lasers with wafer-scale silicon nitride cavities

被引:68
作者
Purnawirman [1 ]
Sun, J. [1 ]
Adam, T. N. [2 ]
Leake, G. [2 ]
Coolbaugh, D. [2 ]
Bradley, J. D. B. [1 ]
Hosseini, E. Shah [1 ]
Watts, M. R. [1 ]
机构
[1] MIT, Elect Res Lab, Photon Microsyst Grp, Cambridge, MA 02139 USA
[2] SUNY Albany, Coll Nanoscale Sci & Engn, Albany, NY 12203 USA
关键词
AL2O3ER3+; GAIN;
D O I
10.1364/OL.38.001760
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report on integrated erbium-doped waveguide lasers designed for silicon photonic systems. The distributed Bragg reflector laser cavities consist of silicon nitride waveguide and grating features defined by wafer-scale immersion lithography and a top erbium-doped aluminum oxide layer deposited as the final step in the fabrication process. The resulting inverted ridge waveguide yields high optical intensity overlap with the active medium for both the 0.98 mu m pump (89%) and 1.5 mu m laser (87%) wavelengths with a pump-laser intensity overlap of >93%. We obtain output powers of up to 5 mW and show lasing at widely spaced wavelengths within both the C and L bands of the erbium gain spectrum (1536, 1561, and 1596 nm). (C) 2013 Optical Society of America
引用
收藏
页码:1760 / 1762
页数:3
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