Polarimetric microfacet scattering theory with applications to absorptive and reflective surfaces

被引：163

作者：

Priest, RG ^{[1
]}

Meier, SR ^{[1
]}

机构：

[1] USN, Res Lab, Div Opt Sci, Washington, DC 20375 USA

来源：

OPTICAL ENGINEERING | 2002年 / 41卷 / 05期

关键词：

polarization; scattering; infrared;

D O I：

10.1117/1.1467360

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We investigate the polarimetric scattering properties of highly absorbing and highly reflective rough surfaces in the IR. We obtain Mueller matrix measurements from these surfaces and compare the data to a Fresnel model. From the data, we determine that a rough, highly absorbing surface has a higher degree of polarization compared to a rough, highly reflective surface. In addition, we present a full polarimetric version of the microfacet model and discuss its properties. This closed-form result for the polarimetric bidirectional reflectance distribution function (BRDF) is derived from the microfacet model. (C) 2002 Society of Photo-Optical instrumentation Engineers.

引用

页码：988 / 993

页数：6

共 18 条

[1] ROUGH SURFACE SCATTERING BASED ON SPECULAR POINT THEORY [J].