A study of laser conditioning methods of hafnia silica multilayer mirrors

被引：21

作者：

Stolz, CJ ^{[1
]}

Sheehan, LM ^{[1
]}

Maricle, SM ^{[1
]}

Schwartz, S ^{[1
]}

Hue, J ^{[1
]}

机构：

[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

来源：

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1998 | 1999年 / 3578卷

关键词：

laser conditioning; laser-induced damage; laser damage morphology; hafnia-silica multilayer coating;

D O I：

10.1117/12.344419

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A variety of 1064-nm laser conditioning methods were investigated to find the optimum method for production of large aperture (0.25 m(2)) multilayer coatings for the National Ignition Facility and Laser MegaJoule. Two conditioning methods were explored, multi-step and single-step on two different laser systems. Off-line conditioning was done on PLATO, a small beam diameter (similar to 1 mm) raster scanning system. On-line conditioning was done on Beamlet, a single beam prototype of the National Ignition Facility with a large rectangular beam (35 cm x 35 cm). Concurrent with this work, coating process development for low-defect density high damage threshold coatings was realized by switching from hafnia to hafnium starting materials. The results of this study suggest that single-step raster-scan off-line laser conditioning is an effective method to raise the damage threshold of multilayer miners deposited from. hafnium and silica by reactive electron beam deposition.

引用

页码：144 / 153

页数：10

共 14 条

[1] REACTIVE EVAPORATION OF LOW-DEFECT DENSITY HAFNIA [J].

CHOW, R ;

FALABELLA, S ;

LOOMIS, GE ;

RAINER, F ;

STOLZ, CJ ;

KOZLOWSKI, MR .

APPLIED OPTICS, 1993, 32 (28) :5567-5574

[2]

FORNIER A, 1994, P SOC PHOTO-OPT INS, V2114, P355, DOI 10.1117/12.180922

[3] Growth of laser-induced damage during repetitive illumination of HfO2-SiO2 multilayer mirror and polarizer coatings [J].

Genin, FY ;

Stolz, CJ ;

Kozlowski, MR .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1996, 1997, 2966 :273-282

[4]

Genin FY, 1996, P SOC PHOTO-OPT INS, V2870, P439, DOI 10.1117/12.259929

[5] HOT IMAGES FROM OBSCURATIONS [J].

HUNT, JT ;

MANES, KR ;

RENARD, PA .

APPLIED OPTICS, 1993, 32 (30) :5973-5982

[6]

Kozlowski M. R., 1990, P SOC PHOTO-OPT INS, V1438, P376

[7]

SHEEHAN L, 1994, P SOC PHOTO-OPT INS, V2114, P559, DOI 10.1117/12.180939

[8]

SMITH DJ, 1995, P SOC PHOTO-OPT INS, V2428, P319

[9]

STAGGS MC, 1992, P SOC PHOTO-OPT INS, V1624, P375, DOI 10.1117/12.60129

[10] Characterization of nodular and thermal defects in hafnia/silica multilayer coatings using optical, photothermal, and atomic force microscopy [J].

Stolz, CJ ;

Yoshiyama, JM ;

Salleo, A ;

Wu, ZL ;

Green, J ;

Krupka, R .

LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997, PROCEEDINGS, 1998, 3244 :475-483

← 1 2 →