Very low energy electron microscopy of graphene flakes

被引：12
作者：
Mikmekova, E. [1 ]
Bouyanfif, H. [2 ]
Lejeune, M. [2 ]
Muellerova, I. [1 ]
Hovorka, M. [1 ]
Uncovsky, M. [3 ]
Frank, L. [1 ]
机构：
[1] Inst Sci Instruments ASCR, Vvi, Brno 61264, Czech Republic
[2] Univ Picardie Jules Verne, Fac Sci Amiens, Phys Mat Condensee Lab, F-80039 Amiens 2, France
[3] FEI Czech Republ Ltd, Brno 61200, Czech Republic
来源：
JOURNAL OF MICROSCOPY | 2013年 / 251卷 / 02期
关键词：
Graphene; very low energy STEM;
D O I：
10.1111/jmi.12049
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
Commercially available graphene samples are examined by Raman spectroscopy and very low energy scanning transmission electron microscopy. Limited lateral resolution of Raman spectroscopy may produce a Raman spectrum corresponding to a single graphene layer even for flakes that can be identified by very low energy electron microscopy as an aggregate of smaller flakes of various thicknesses. In addition to diagnostics of graphene samples at larger dimensions, their electron transmittance can also be measured at very low energies.
引用
收藏
页码：123 / 127
页数：5
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