Photoluminescence properties of self-assembled InN dots embedded in GaN grown by metal organic vapor phase epitaxy

被引:62
作者
Ke, W. C. [1 ]
Fu, C. P.
Chen, C. Y.
Lee, L.
Ku, C. S.
Chou, W. C.
Chang, W. -H.
Lee, M. C.
Chen, W. K.
Lin, W. J.
Cheng, Y. C.
机构
[1] Natl Tsing Hua Univ, Dept Electrophys, Hsinchu 300, Taiwan
[2] Chung Shan Inst Sci & Technol, Tao Yuan 325, Taiwan
关键词
D O I
10.1063/1.2203510
中图分类号
O59 [应用物理学];
学科分类号
摘要
Photoluminescence (PL) properties of InN dots embedded in GaN were investigated. We observed a systematic blueshift in the emission energy as the average dot height was reduced. The widely size-tunable emission energy can be ascribed to the size quantization effect. Temperature-dependent PL measurements show that the emission peak energies of the dots are insensitive to temperature, as compared with that of bulk film, indicating the localization of carriers in the dots. A reduced quenching of the PL from the InN dots was also observed, implying superior emission properties for the embedded InN dot structures. (c) 2006 American Institute of Physics.
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页数:3
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