共 20 条
[3]
He Z., 2019, Opt. Optoelectron. Technol, V17, P63, DOI [10.19519/j.cnki.1672-3392.2019.01.012, DOI 10.19519/J.CNKI.1672-3392.2019.01.012]
[5]
Phase Measuring Deflectometry:: a new approach to measure specular free-form surfaces
[J].
OPTICAL METROLOGY IN PRODUCTION ENGINEERING,
2004, 5457
:366-376
[7]
Li X, 2011, SCI CHINA TECHNOL SC, V57, P2504
[10]
Mao C L, 2018, ACTA OPT SINICA, V38