High-bandwidth nanopositioner with magnetoresistance based position sensing

被引:36
作者
Kartik, Venkataraman [1 ]
Sebastian, Abu [1 ]
Tuma, Tomas [1 ]
Pantazi, Angeliki [1 ]
Pozidis, Haralampos [1 ]
Sahoo, Deepak R. [1 ]
机构
[1] IBM Res Zurich, CH-8803 Ruschlikon, Switzerland
关键词
Nanopositioning; Scanners; Magnetoresistance sensors; H-infinity Control; Atomic force microscopy; ATOMIC-FORCE MICROSCOPY; DESIGN; DYNAMICS;
D O I
10.1016/j.mechatronics.2011.07.009
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Nanopositioning is a key enabling technology for nanoscale metrology and manipulation. This paper details experimental studies aimed at achieving high-bandwidth nanopositioning through a combination of scanner design with excellent dynamical behavior, novel high-bandwidth position sensing, and modern control techniques. Through a combination of high stiffness/rigidity of the flexures, a low carried mass, and uncomplicated mechanical connections, an X/Y scanner is designed which has the first resonant frequencies beyond 4 kHz in both scan axes. For closed-loop operation of such fast scanners, there is a need for high-bandwidth, low-noise sensing schemes. A sensing concept based on magnetoresistance is presented that shows great potential towards providing low-noise position sensing over a very wide bandwidth. Atomic force microscopy imaging experiments of nanoscale structures are presented to illustrate the frame-per-second imaging capability of the nanopositioning system. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码:295 / 301
页数:7
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