Sub-Rayleigh imaging via speckle illumination

被引：90

作者：

Oh, Joo-Eon ^{[1
]}

Cho, Young-Wook ^{[1
]}

Scarcelli, Giuliano ^{[2
,3
]}

Kim, Yoon-Ho ^{[1
]}

机构：

[1] Pohang Univ Sci & Technol POSTECH, Dept Phys, Pohang 790784, South Korea

[2] Harvard Univ, Sch Med, Boston, MA 02114 USA

[3] Massachusetts Gen Hosp, Wellman Ctr Photomed, Boston, MA 02114 USA

来源：

OPTICS LETTERS | 2013年 / 38卷 / 05期

基金：

新加坡国家研究基金会;

关键词：

DIFFRACTION-LIMIT; RESOLUTION LIMIT; MICROSCOPY; LIGHT;

D O I：

10.1364/OL.38.000682

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate sub-Rayleigh limit imaging of an object via speckle illumination. Imaging beyond the conventional Rayleigh limit is achieved by illuminating the object with pseudothermal light that exhibits a random speckle pattern. An object image is reconstructed from the second-order correlation measurement and the resolution of the image, which exceeds the Rayleigh limit, is shown to be related to the size of the speckle pattern that is tied to the lateral coherence length of the pseudothermal light. (c) 2013 Optical Society of America

引用

页码：682 / 684

页数：3

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