III-V Multi-Junction Solar Cells on Si Substrates with a Voided Ge Interface Layer: A Modeling Study

被引:0
作者
Beattie, Meghan N. [1 ]
Bioud, Youcef A. [2 ]
Boucherif, Abderraouf [2 ]
Drouin, Dominique [2 ]
Ares, Richard [2 ]
Valdivia, Christopher E. [1 ]
Hinzer, Karin [1 ]
机构
[1] Univ Ottawa, Ctr Res Photon, SUNLAB, Ottawa, ON K1N 6N5, Canada
[2] Univ Sherbrooke, 3IT, CNRS UMI 3463, LN2, Sherbrooke, PQ, Canada
来源
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC) | 2018年
基金
加拿大自然科学与工程研究理事会;
关键词
voided germanium; multi-junction solar cells; concentrator photovoltaics; lattice mismatched substrate; threading dislocations; inorganic semiconductors; modeling; SILICON; FILMS;
D O I
暂无
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Multi-junction solar cell efficiencies far exceed those attainable with silicon photovoltaics; however, the high cost of materials remains a barrier to their widespread use. Substantial cost reduction could be achieved by replacing the germanium substrate with a less expensive alternative: silicon. However, threading dislocations introduced by the lattice mismatch between silicon and other layers have a detrimental effect on performance. In this research, we seek to accommodate lattice mismatch by introducing a voided germanium interface layer on the silicon substrate to intercept dislocations and prevent them from reaching the active layers. We present simulation results exploring the effect of threading dislocations and substrate doping on device performance. For insufficient substrate doping, a potential barrier forms at the germanium/silicon interface, restricting current flow. This barrier becomes larger under concentration, necessitating higher doping (similar to 10(19) cm(-3)) in the substrate layer. We show that for dislocation densities of 10(6) cm(-2), an efficiency of 28% is theoretically achievable under 100 sun concentration when the voided germanium interface and the silicon substrate are highly doped. For very low defect densities of 10(4) cm(-2), an efficiency of 36% could be achieved.
引用
收藏
页码:0180 / 0184
页数:5
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