Electrical properties of microcrystalline Sc3N@C80 fullerene

被引:3
作者
Takase, Tsuyoshi [1 ]
Sakaino, Masamichi [1 ]
Kirimoto, Kenta [2 ]
Sun, Yong [1 ]
机构
[1] Kyushu Inst Technol, Dept Appl Sci Integrated Syst Engn, Kitakyushu, Fukuoka 8048550, Japan
[2] Kitakyushu Natl Coll Technol, Dept Elect & Elect Engn, Kitakyushu, Fukuoka 8020985, Japan
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2013年 / 112卷 / 04期
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
C-60; STABILITY;
D O I
10.1007/s00339-012-7449-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electrical properties of microcrystalline Sc3N@C-80 fullerene with fcc structure are studied by measuring both d.c. conductivity temperature dependence and a.c. impedance. Below 450 K the Sc3N@C-80 sample has an energy band gap of 1.71 eV, which does not depend on the strength of the applied electric field. But when the temperature is above 450 K, a phase transition which results in a small band gap of 1.22 eV occurs under electric field strengths larger than 1 kV/cm. We also found from Cole-Cole plots of a.c. impedance that the contact resistance at the Au/Sc3N@C-80 interface is less than that at the Au/C-60 interface.
引用
收藏
页码:927 / 931
页数:5
相关论文
共 19 条
[1]   Electronic structure of pristine and intercalated Sc3N@C80 metallofullerene -: art. no. 035107 [J].
Alvarez, L ;
Pichler, T ;
Georgi, P ;
Schwieger, T ;
Peisert, H ;
Dunsch, L ;
Hu, Z ;
Knupfer, M ;
Fink, J ;
Bressler, P ;
Mast, M ;
Golden, MS .
PHYSICAL REVIEW B, 2002, 66 (03) :351071-351077
[2]   Electronic states and molecular symmetry of the higher fullerene C-80 [J].
Cummins, TR ;
Burk, M ;
Schmidt, M ;
Armbruster, JF ;
Fuchs, D ;
Adelmann, P ;
Schuppler, S ;
Michel, RH ;
Kappes, MM .
CHEMICAL PHYSICS LETTERS, 1996, 261 (03) :228-233
[3]   Contact electrode diffusion into C-60 thin films [J].
Firlej, L ;
Zahab, A ;
Brocard, F ;
Kirova, N .
SYNTHETIC METALS, 1997, 86 (1-3) :2331-2332
[4]   On the stabilization of fullerenes by caged atoms:: Singly and multiply charged Sc3N@C78 and Sc3N@C80 ions [J].
Gluch, K ;
Feil, S ;
Matt-Leubner, S ;
Echt, O ;
Scheier, P ;
Märk, TD .
JOURNAL OF PHYSICAL CHEMISTRY A, 2004, 108 (34) :6990-6995
[5]   Isolation and characterisation of two Sc3N@C80 isomers [J].
Krause, M ;
Dunsch, L .
CHEMPHYSCHEM, 2004, 5 (09) :1445-1449
[6]   Structure and stability of endohedral fullerene Sc3N@C80:: A Raman, infrared, and theoretical analysis [J].
Krause, M ;
Kuzmany, H ;
Georgi, P ;
Dunsch, L ;
Vietze, K ;
Seifert, G .
JOURNAL OF CHEMICAL PHYSICS, 2001, 115 (14) :6596-6605
[7]   THE STABILITY OF THE FULLERENES C-24, C-28, C-32, C-36, C-50, C-60 AND C-70 [J].
KROTO, HW .
NATURE, 1987, 329 (6139) :529-531
[8]   The nano-forms of carbon [J].
Luis Delgado, Juan ;
Angeles Herranz, M. ;
Martin, Nazario .
JOURNAL OF MATERIALS CHEMISTRY, 2008, 18 (13) :1417-1426
[9]   MOLECULAR GRAPHS, POINT GROUPS, AND FULLERENES [J].
MANOLOPOULOS, DE ;
FOWLER, PW .
JOURNAL OF CHEMICAL PHYSICS, 1992, 96 (10) :7603-7614
[10]   AB-INITIO MOLECULAR-ORBITAL CALCULATION FOR C70 AND 7 ISOMERS OF C80 [J].
NAKAO, K ;
KURITA, N ;
FUJITA, M .
PHYSICAL REVIEW B, 1994, 49 (16) :11415-11420