Some new lower bounds to centered and wrap-round L2-discrepancies

被引：57

作者：

Chatterjee, Kashinath ^{[3
]}

Li, Zhaohai ^{[2
]}

Qin, Hong ^{[1
]}

机构：

[1] Cent China Normal Univ, Dept Stat, Wuhan, Peoples R China

[2] George Washington Univ, Dept Stat, Washington, DC 20052 USA

[3] Visva Bharati Univ, Dept Stat, Santini Ketan, W Bengal, India

来源：

STATISTICS & PROBABILITY LETTERS | 2012年 / 82卷 / 07期

关键词：

U-type designs; Centered L-2-discrepancy; Wrap-around L-2-discrepancy; UNIFORM DESIGNS; AROUND L-2-DISCREPANCY;

D O I：

10.1016/j.spl.2012.03.011

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

We study the uniformity of two-level U-type designs based on the centered and wrap-around L-2-discrepancies. Based on the known formulation of the measures of uniformity, we present some new lower bounds to centered and wrap-around L-2-discrepancies, which can be used as benchmarks in searching uniform U-type designs or helping to proof that a good design is in fact uniform. Using the efficient algorithm proposed in Fang et al. (2003), some two-level uniform designs are obtained. Crown Copyright (C) 2012 Published by Elsevier B.V. All rights reserved.

引用

页码：1367 / 1373

页数：7

共 13 条

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