Complex ridgelets for shift invariant characterization of surface topography with line singularities

被引：17
作者：
Ma, JW [1 ]
Jiang, XQ
Scott, P
机构：
[1] Univ Huddersfield, Ctr Precis Technol, Huddersfield HD1 3DH, W Yorkshire, England
[2] Univ Grenoble 1, Lab IMAG, LMC, F-38041 Grenoble, France
[3] Taylor Hobson Ltd, Leicester LE4 9JQ, Leics, England
来源：
PHYSICS LETTERS A | 2005年 / 344卷 / 06期
基金：
英国工程与自然科学研究理事会;
关键词：
ridgelets; surface characterization; radon transform; shift invariance; line singularities;
D O I：
10.1016/j.physleta.2005.06.091
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
A complex ridgelet transform, which provides shift invariance and good performance for line singularities, is proposed to solve the problems with existing wavelet-based methods in surface metrology by taking a dual-tree complex wavelet transform on the projections of the finite Radon transform. Numerical experiments show the efficiency of this methodology in approximation, denoising, and characterization of engineering and bioengineering surfaces with straight scratches. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：423 / 431
页数：9
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