Organic-Oxide Cathode Buffer Layer in Fabricating High-Performance Polymer Light-Emitting Diodes

被引:43
作者
Lee, Tsung-Hsun [1 ]
Huang, Jung-Chun-Andrew [1 ]
Pakhomov, Georgi L'vovich [2 ]
Guo, Tzung-Fang [2 ]
Wen, Ten-Chin [3 ]
Huang, Yi-Shun [3 ]
Tsou, Chuan-Cheng
Chung, Chia-Tin
Lin, Ying-Chang [4 ]
Hsu, Yao-Jane [4 ]
机构
[1] Natl Cheng Kung Univ, Dept Phys, Ctr Micro Nano Sci Technol, Inst Innovat & Adv Studies, Tainan 701, Taiwan
[2] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Inst Electroopt Sci & Engn, Tainan 701, Taiwan
[3] Natl Cheng Kung Univ, Dept Chem Engn, Tainan 701, Taiwan
[4] Natl Synchrotron Radiat Res Ctr, Hsinchu 30076, Taiwan
关键词
D O I
10.1002/adfm.200800403
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Spin-casting or thermal evaporation in vacuum of a salt-free, neutral, organic-oxide ultra-thin film as a buffer layer with an aluminum (Al) cathode has become an alternative approach for fabricating high-performance organic and polymer light-emitting diodes (O/PLEDs). [Guo et al., Appl. Phys. Lett. 2006, 88,113501 and Appl. Phys. Lett. 2006, 89, 053507] The electroluminescence efficiency of phenyl-substituted poly(para-phenylene vinylene) copolymer-based PLEDs is 0.16 cd A(-1) when Al is used as the device cathode, but is approximately two orders of magnitude higher, 14.53 cd A(-1), when an organic oxide/Al composite cathode is used. The polymer/metal junction in PLEDs with and without depositing an ultra-thin organic oxide interlayer is studied by X-ray photoelectron spectroscopy. Experimental results indicate that the deposition of an Al electrode causes the oxidation at the surface of the light-emissive polymer layer. Introducing an organic-oxide cathode buffer layer suppresses the oxidation and the diffusion of the Al atoms into the functional polymer layer. The formation of a carbide-like (negative carbon) thin layer, which accompanies interfacial interactions, is critical to the injection of electrons through the Al cathode. The balanced charge injection is responsible for the substantially improved device performance. This process is specific to the organic oxide/Al interface, as revealed by a comparison with similar device configurations that have Ag as the electrode, in which no significant interaction in the interface is observed.
引用
收藏
页码:3036 / 3042
页数:7
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