Atomic-resolution dynamic force microscopy/spectroscopy of individual single-walled carbon nanotube

被引：5
|
作者：
Ashino, M
Wiesendanger, R
机构：
[1] Univ Hamburg, Inst Phys Appl, D-20355 Hamburg, Germany
[2] Univ Hamburg, Microstruct Adv Res Ctr, D-20355 Hamburg, Germany
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 3B期
关键词：
carbon nanotubes; frequency modulation dynamic force microscopy; force spectroscopy; noncontact regime; short-range force;
D O I：
10.1143/JJAP.45.2286
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report the atomic-resolution imaging of an individual single-walled carbon nanotube and quantitative measurements of forces above specific atomic sites by dynamic force microscopy and three-dimensional force field spectroscopy at low temperatures. The detailed structure, i.e., the pair of indices (n, m) corresponding to a chiral angle phi and diameter d, is derived from atomic resolution images. Through the evaluation of short-range forces, the chemical reactivity of nanotube surface is found to be very weak when the interatomic short-range van der Waals forces are dominant.
引用
收藏
页码：2286 / 2289
页数：4
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