Ionizing Radiation Response of the 4558 Analog Processor/Analog-to-Digital Converter

被引：0

作者：

Witczak, Steven C. ^{[1
]}

Horner, Jeremiah J. ^{[1
]}

Harms, David C. ^{[1
]}

Mason, Todd S. ^{[1
]}

Marino, Kristin E. ^{[1
]}

Macejik, Glen E. ^{[1
]}

机构：

[1] Northrop Grumman Mission Syst, Linthicum Hts, MD 21090 USA

来源：

2017 IEEE RADIATION EFFECTS DATA WORKSHOP (REDW) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Northrop Grumman 4558 Analog Processor / Analog-to-Digital Converter was evaluated for tolerance to ionizing radiation at moderate doses. Radiation-induced shifts in non-linearity, noise, gain, offset and power dissipation are inferred from the transfer characteristics. Neither irradiation nor post-irradiation anneal has a measurable effect on the performance parameters. The radiation hardness is attributed in part to a p+ guardband under the isolation oxides. Given measurement error, acceptable beginning-of-life parametric ranges are provided to ensure specification compliance when only one set of measurements is performed.

引用

页码：105 / 108

页数：4

共 7 条

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