Mesoporous silica powders and films - Pore size characterization by krypton adsorption

被引:20
作者
Chiu, CY
Chiang, AST
Chao, KJ [1 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem, Hsinchu 300, Taiwan
[2] Natl Cent Univ, Dept Chem & Mat Engn, Chungli 32054, Taiwan
关键词
Kr adsorption; mesoporous silica; thin film;
D O I
10.1016/j.micromeso.2005.12.003
中图分类号
O69 [应用化学];
学科分类号
081704 ;
摘要
An experimental correlation was established between pore size derived from N-2 adsorption, D-N2, and capillary condensation/evaporation pressure, (P/P-0)(t,Kr), obtained from Kr adsorption/desorption isotherms on powdery siliceous MCM-41, MCM-48 and SBA-15 samples, and was analyzed by the DBdB theory. The correlation was then used to estimate the pore size distribution from the Kr adsorption isotherm of mesoporous silica layers on Si(100) wafer prepared using P123 and Brij (R) 56 surfactants. It was found by TEM analysis that the pore shape in the thin films was distorted from circular to ellipsoidal, leading to different pore sizes estimated from the adsorption and desorption branches of the Kr isotherm. (c) 2005 Elsevier Inc. All rights reserved.
引用
收藏
页码:244 / 253
页数:10
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