Novel implementations of relaxation methods for measuring residual stresses at the micron scale

被引：18

作者：

Winiarski, Bartlomiej ^{[1
,2
]}

Withers, Philip J. ^{[2
]}

机构：

[1] FEI Co, Eindhoven, Netherlands

[2] Univ Manchester, Sch Mat, Manchester M13 9PL, Lancs, England

来源：

JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN | 2015年 / 50卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

Incremental hole drilling; ring core; mechanical relaxation methods; sectioning; intergranular stress; DIGITAL IMAGE CORRELATION; SCANNING-ELECTRON-MICROSCOPE; HOLE-DRILLING METHOD; THIN-FILMS; DEFORMATION MEASUREMENT; ION-IMPLANTATION; SLITTING METHOD; ELASTIC STRAIN; DEPTH; PATTERNS;

D O I：

10.1177/0309324715590957

中图分类号：

TH [机械、仪表工业];

学科分类号：

0802 ;

摘要：

The advent of dual-beam focused ion beam - field emission gun scanning electron microscope (FIB-SEM) imaging and milling systems in combination with digital image correlation (DIC) analysis has made it possible to make very fine excisions and to record the resulting displacements with nanometre precision. This has led to novel implementations of macroscale residual stress measurement methods to the microscale, for example, micro-slotting, micro-hole drilling and so on. This review article outlines the different methods for residual stress mapping at the micron scale highlighting their relative merits and limitations with the aim of guiding the user towards the most appropriate techniques for a given application. These open new possibilities for residual stress measurement not just at the continuum scale but even for mapping stresses within grains. In addition, recent advances in milling throughput promised by new dual-beam plasma focused ion beam systems promise to help bridge the gap between the conventional macroscale methods and their micron-scale counterparts.

引用

页码：412 / 425

页数：14

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