Measurement of X-ray mass attenuation coefficient of nickel around the K-edge using synchrotron radiation based X-ray absorption study

被引：6
|
作者：
Roy, Bunty Rani [1 ]
Rajput, Parasmani [2 ]
Jha, S. N. [2 ]
Rao, A. S. Nageswara [1 ]
机构：
[1] Kakatiya Univ, Dept Phys, Warangal 506009, Telangana State, India
[2] Bhabha Atom Res Ctr, Atom & Mol Phys Div, Bombay 400085, Maharashtra, India
来源：
RADIATION PHYSICS AND CHEMISTRY | 2015年 / 114卷
关键词：
Mass attenuation coefficients; Synchrotron radiation; XAFS; PHOTOELECTRIC CROSS-SECTIONS; MEDIUM-Z ELEMENTS; ENERGY-RANGE; 5; VALIDITY; TA; CR;
D O I：
10.1016/j.radphyschem.2015.05.032
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The work presents the X-ray absorption fine structure (XAFS) technique for measuring the X-ray mass attenuation coefficient of nickel metal foil in the X-ray energy range of 8271.2-8849.4 eV using scanning XAFS beam line (BL-09) at Indus-2 synchrotron radiation source facility, Raja Ramanna Centre for Advanced Technology (RRCAT) at Inclore, India. The result represents the X-ray mass attenuation coefficient data for 0.02 mm thick Ni metal foil in the XAFS region of Ni K-edge. However, the results are compared to theoretical values using X-COM. There is a maximum deviation which is found exactly near the K-edge jump and decreases as we move away from the absorption edge. Oscillatory structure appears just above the observed absorption edge i.e., 8348.7 eV and is confined to around 250 eV above the edge. (C) 2015 Elsevier Ltd. All rights reserved.
引用
收藏
页码：38 / 42
页数：5
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