Experimental demonstration of laser damage caused by interface coupling effects of substrate surface and coating layers

被引:22
作者
Chai, Yingjie [1 ,2 ]
Zhu, Meiping [1 ]
Yi, Kui [1 ]
Zhang, Weili [1 ]
Wang, Hu [1 ,2 ]
Fang, Zhou [1 ,2 ]
Bai, Zhengyuan [1 ,2 ]
Cui, Yun [1 ]
Shao, Jianda [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab Mat High Power Laser, Shanghai 201800, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
FUSED-SILICA; THRESHOLD; DENSITY; NM;
D O I
10.1364/OL.40.003731
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The laser damage resistance of the coatings for high-power laser systems depends greatly on the surface quality of the substrate. In our work, experimental approaches were employed to understand the interface coupling effect of the substrate surface and coatings on the laser resistance of the coatings. A 1064 nm anti-reflection (AR) coating was deposited by an e-beam coater onto fused silica with and without micro-scale pits (structural defects). The micro-scale pits were precisely fabricated by femtosecond laser processing to prevent the emergence of subsurface cracks. Different deposition temperatures were characterized in order to verify the intensity of the interface coupling effect of the substrate and coating layers. Our experimental results indicate that impurities that are introduced in the finishing process, shifted to the substrate surface, and aggregated during the heating process, play a much more crucial role than structural defects (length: similar to 7 mu m; width: similar to 3 mu m; depth: similar to 0.8 mu m) in the laser-induced damage process. By effectively reducing the intensity of the interface coupling effect, the e-beam AR coatings, whose laser-induced damage resistance was closed to the bare substrate, was prepared. (C) 2015 Optical Society of America
引用
收藏
页码:3731 / 3734
页数:4
相关论文
共 19 条
[1]   Subsurface damage and polishing compound affect the 355-nm laser damage threshold of fused silica surfaces [J].
Camp, DW ;
Kozlowski, MR ;
Sheehan, LM ;
Nichols, M ;
Dovik, M ;
Raether, R ;
Thomas, I .
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1997, PROCEEDINGS, 1998, 3244 :356-364
[2]  
Chai Y., 2014, P SOC PHOTO-OPT INS, V9237, P92370
[3]   Impact of substrate pits on laser-induced damage performance of 1064-nm high-reflective coatings [J].
Chai, Yingjie ;
Zhu, Meiping ;
Bai, Zhengyuan ;
Yi, Kui ;
Wang, Hu ;
Cui, Yun ;
Shao, Jianda .
OPTICS LETTERS, 2015, 40 (07) :1330-1333
[4]   Generation and measurement of complex laser pulse shapes in the SG-III laser facility [J].
Hu, Dongxia ;
Dong, Jun ;
Xu, Dangpeng ;
Huang, Xiaoxia ;
Zhou, Wei ;
Tian, Xiaocheng ;
Zhou, Dandan ;
Guo, Huaiwen ;
Zhong, Wei ;
Deng, Xuewei ;
Zhu, Qihua ;
Zheng, Wanguo .
CHINESE OPTICS LETTERS, 2015, 13 (04)
[5]   Real-time damage event imaging reveals the absorber inducing laser damage with low density in solgel antireflective coatings [J].
Hu, Guohang ;
Zhao, Yuanan ;
Shao, Jianda ;
Yi, Kui ;
Li, Dawei ;
Liu, Xiaofeng ;
Xiao, Qiling .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2013, 30 (05) :1186-1193
[6]   MEASUREMENT OF A GAUSSIAN LASER-BEAM SPOT SIZE USING A BOUNDARY DIFFRACTION WAVE [J].
KIMURA, S ;
MUNAKATA, C .
APPLIED OPTICS, 1988, 27 (01) :84-88
[7]   Investigation of nanoprecursors threshold distribution in laser-damage testing [J].
Krol, H ;
Gallais, L ;
Grèzes-Besset, C ;
Natoli, JY ;
Commandré, M .
OPTICS COMMUNICATIONS, 2005, 256 (1-3) :184-189
[8]   Study on high-reflective coatings of different designs at 532 nm [J].
Liu, Jie ;
Zhang, Weili ;
Cui, Hui ;
Sun, Jian ;
Li, Hao ;
Yi, Kui ;
Zhu, Meiping .
CHINESE OPTICS LETTERS, 2014, 12 (08)
[9]   Postprocessing treatments to improve the laser damage resistance of fused silica optical surfaces and SiO2 coatings [J].
Liu, Wenwen ;
Wei, Chaoyang ;
Yi, Kui ;
Shao, Jianda .
CHINESE OPTICS LETTERS, 2015, 13 (04)
[10]   Investigations on single and multiple pulse laser-induced damages in HfO2/SiO2 multilayer dielectric films at 1064 nm [J].
Liu, Wenwen ;
Wei, Chaoyang ;
Wu, Jianbo ;
Yu, Zhenkun ;
Cui, Hui ;
Yi, Kui ;
Shao, Jianda .
OPTICS EXPRESS, 2013, 21 (19) :22476-22487