Ultra-thin condensers for optical subwavelength resolution microscopy

被引：18

作者：

Desai, Darshan B. ^{[1
]}

Dominguez, Daniel ^{[1
,2
]}

Bernussi, Ayrton A. ^{[2
,3
]}

de Peralta, Luis Grave ^{[1
,2
]}

机构：

[1] Texas Tech Univ, Dept Phys, Lubbock, TX 79409 USA

[2] Texas Tech Univ, Nano Tech Ctr, Lubbock, TX 79409 USA

[3] Texas Tech Univ, Dept Elect & Comp Engn, Lubbock, TX 79409 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2014年 / 115卷 / 09期

关键词：

PLASMON-COUPLED EMISSION; FIELD; LEAKAGE; FLUORESCENCE; SUPERLENS; FILMS;

D O I：

10.1063/1.4867295

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present optical subwavelength resolution images of periodic patterned nanostructures using ultra-thin condensers (UTCs) illuminated by evanescent waves. We demonstrate bright and dark field microscopy using UTCs based on two types of surface wave illumination: surface plasmon polaritons and evanescent waves related to total internal reflection. We provide a discussion about the potential of UTCs for deep subwavelength resolution microscopy, and we discuss the similarities and differences between proposed UTCs, traditional bulky optical condensers, and several demonstrated superlenses. (C) 2014 AIP Publishing LLC.

引用

页数：5

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