Atomic imaging and spectroscopy of low-dimensional materials with interrupted periodicities

被引：9

作者：

Suenaga, Kazu ^{[1
]}

Akiyama-Hasegawa, Kotone ^{[1
,2
]}

Niimi, Yoshiko ^{[1
]}

Kobayashi, Haruka ^{[1
]}

Nakamura, Midori ^{[1
]}

Liu, Zheng ^{[1
]}

Sato, Yuta ^{[1
]}

Koshino, Masanori ^{[1
]}

Iijima, Sumio ^{[1
,2
]}

机构：

[1] Natl Inst Adv Ind Sci & Technol, Nanotube Res Ctr, Tsukuba, Ibaraki 3058565, Japan

[2] Meijo Univ, Nagoya, Aichi 4688502, Japan

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2012年 / 61卷 / 05期

基金：

日本科学技术振兴机构;

关键词：

STEM; defects; low-dimensional materials; EELS; graphene; GRAPHENE; DEFECTS;

D O I：

10.1093/jmicro/dfs054

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Identification of individual atoms and examination of their electronic properties in materials are the ultimate goal of all microscopy-based analytical techniques. Here, we demonstrate successful single-atom imaging and spectroscopy in low-dimensional materials using (scanning) transmission electron microscopy together with electron energy-loss spectroscopy (EELS). Edges and point defects in single-layered materials such as graphene, hexagonal boron nitride and WS2 nanoribbons are investigated by annular dark-field imaging and EELS fine-structure analysis. Individual dopant atoms are unambiguously identified in nano-peapods. It is noteworthy that irradiation damage and specimen contamination even at the single-atom level are crucial issues in these experiments.

引用

页码：285 / 291

页数：7

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