Influence of roughness surfaces on third-order nonlinear-optical properties of erbium-doped zinc oxide thin films

被引：13

作者：

Lamrani, M. Alaoui ^{[1
]}

El Jouad, M. ^{[1
]}

Addou, M. ^{[1
]}

El Habbani, T. ^{[1
]}

Fellahi, N. ^{[1
]}

Bahedi, K. ^{[1
]}

Touhami, M. Ebn ^{[1
]}

Essaidi, Z. ^{[2
]}

Sofiani, Z. ^{[2
]}

Sahraoui, B. ^{[2
]}

Meghea, A. ^{[3
]}

Rau, I. ^{[3
]}

机构：

[1] Univ Ibn Tofail, Lab Optoelect & Physicochim Mat, Fac Sci, Kenitra 14000, Morocco

[2] Univ Angers, CNRS, UMR 6136, Lab POMA, Angers, France

[3] Univ Politechn Bucharest, Fac Appl Chem & Mat Sci, Bucharest, Romania

来源：

SPECTROSCOPY LETTERS | 2008年 / 41卷 / 06期

关键词：

spray; zinc oxide; nonlinear optical susceptibility; roughness surface;

D O I：

10.1080/00387010802286692

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Zinc oxide (ZnO) and erbium-doped zinc oxide (ZnO:Er) thin films were deposited on heated glass substrates using the spray pyrolysis technique. Third-order nonlinear-optical properties of the thin films have been investigated using the third harmonic generation (THG) at wavelength of 1064nm in picosecond regime. The dependence of third-order nonlinear susceptibility and transmission characteristics on the thin films roughness has been evaluated. Third-order nonlinear optical susceptibility ((3)) values of the studied materials were in the remarkable range of 10-2 esu. The morphologic properties of the deposited films have been analyzed using x-ray diffraction (XRD) and atomic force microscopy (AFM) and the luminescence properties by cathodoluminescence (CL). A correlation between optical properties and structural properties is given.

引用

页码：292 / 298

页数：7