Frequency-modulation Kelvin probe force microscopy under tapping mode operation for surfaces with large protrusions

被引：5

作者：

Misaka, Tomoki ^{[1
]}

Kajimoto, Kentaro ^{[1
]}

Araki, Kento ^{[1
]}

Otsuka, Yoichi ^{[1
]}

Matsumoto, Takuya ^{[1
]}

机构：

[1] Osaka Univ, Grad Sch Sci, Dept Chem, 1-1 Machikaneyama Cho, Toyonaka, Osaka, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2020年 / 59卷 / 09期

关键词：

Kelvin probe force microscopy; Atomic force microscopy; nanoparticles; Amplitude modulation; Frequency-modulation; CONTACT POTENTIAL DIFFERENCE; CHARGE SEPARATION; MONOLAYERS; JUNCTIONS;

D O I：

10.35848/1347-4065/abac6e

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Kelvin probe force microscopy (KPFM) is a useful technique for simultaneously visualizing topography and contact potential difference (CPD). Although frequency-modulation (FM) KPFM has high spatial resolution and sensitivity, it is not readily applicable to measuring large protrusions owing to the instability of the feedback condition. Here we investigate the combined use of amplitude-modulation and FM for tip-sample distance control and electrostatic force detection, respectively. The proposed method enabled simultaneous acquisition of topography and CPD images of gold nanoparticles on a Nb-doped TiO2(100) surface. The effect of the tip shape and tilt angle on the CPD images is also discussed. (c) 2020 The Japan Society of Applied Physics

引用

页数：5

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