Shot Noise of a Temperature-Biased Tunnel Junction

被引：26

作者：

Larocque, Samuel ^{[1
]}

Pinsolle, Edouard ^{[1
]}

Lupien, Christian ^{[1
]}

Reulet, Bertrand ^{[1
]}

机构：

[1] Univ Sherbrooke, Inst Quant, Dept Phys, Sherbrooke, PQ J1K 2RI, Canada

来源：

PHYSICAL REVIEW LETTERS | 2020年 / 125卷 / 10期

基金：

加拿大创新基金会; 加拿大自然科学与工程研究理事会;

关键词：

THERMAL AGITATION; THERMOMETRY;

D O I：

10.1103/PhysRevLett.125.106801

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report the measurement of the current noise of a tunnel junction driven out of equilibrium by a temperature and/or voltage difference, i.e., the charge noise of heat and/or electrical current. This is achieved by a careful control of electron temperature below 1 K at the nanoscale, and a sensitive measurement of noise with wide bandwidth, from 0.1 to 1 GHz. An excellent agreement between experiment and theory with no fitting parameter is obtained. In particular, we find that the current noise of the junction of resistance R when one electrode is at temperature T and the other one at zero temperature is given by S = 2 ln 2k(B)T/R.

引用

页数：5

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