共 6 条
- [1] Characterization of two-dimensional dopant profiles: Status and review [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (01): : 196 - 201
- [4] Two-dimensional dopant profiling of ultrashallow junctions by electron holography [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (06): : 3063 - 3066
- [6] VOELKL, 1999, INTRO ELECT HOLOGRAP