Development of high-Tc SQUID microscope with flux guide

被引:20
作者
Tanaka, S [1 ]
Matsuda, K [1 ]
Yamazaki, O [1 ]
Natsume, M [1 ]
Ota, H [1 ]
Mizoguchi, T [1 ]
机构
[1] Toyohashi Univ Technol, Dept Ecol Engn, Toyohashi, Aichi 4418580, Japan
关键词
D O I
10.1088/0953-2048/15/1/326
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have developed a new type of superconducting interference device (SQUID) microscope. A direct-coupled SQUID magnetometer with a high-mu metal needle was used and the substrate was machined to create a dimple for the needle at the centre of the pick-up loop. One end of the needle penetrated through the superconducting pick-up loop in a vacuum; the needle was fixed in the vacuum window with the other end at room temperature in the outside atmosphere. Several kinds of simulation using a Maxwell simulator were performed and the results were applied to our system. As a demonstration, a laser-printed output was scanned by the microscope. Line bars with a line width of 100 mum and a spacing between lines of 200 mum were clearly imaged.
引用
收藏
页码:146 / 149
页数:4
相关论文
共 11 条
[1]   MAGNETIC MICROSCOPY USING A LIQUID-NITROGEN COOLED YBA2CU3O7 SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE [J].
BLACK, RC ;
MATHAI, A ;
WELLSTOOD, FC ;
DANTSKER, E ;
MIKLICH, AH ;
NEMETH, DT ;
KINGSTON, JJ ;
CLARKE, J .
APPLIED PHYSICS LETTERS, 1993, 62 (17) :2128-2130
[2]   HTS scanning SQUID microscopy of active circuits [J].
Fleet, EF ;
Chatraphorn, S ;
Wellstood, FC ;
Knauss, LA .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) :4103-4106
[3]   Magnetic flux guide for high-resolution SQUID microscope [J].
Gudoshnikov, SA ;
Deryuzkina, YV ;
Rudenchik, PE ;
Sitnov, YS ;
Bondarenko, SI ;
Shablo, AA ;
Pavlov, PP ;
Kalabukhov, AS ;
Snigirev, OV ;
Seidel, P .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) :219-222
[4]   HIGH-RESOLUTION SCANNING SQUID MICROSCOPE [J].
KIRTLEY, JR ;
KETCHEN, MB ;
STAWIASZ, KG ;
SUN, JZ ;
GALLAGHER, WJ ;
BLANTON, SH ;
WIND, SJ .
APPLIED PHYSICS LETTERS, 1995, 66 (09) :1138-1140
[5]   High-transition temperature superconducting quantum interference device microscope [J].
Lee, TS ;
Dantsker, E ;
Clarke, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (12) :4208-4215
[6]   Micro-imaging system using scanning DC-SQUID microscope [J].
Morooka, T ;
Nakayama, S ;
Odawara, A ;
Ikeda, M ;
Tanaka, S ;
Chinone, K .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) :3491-3494
[7]   HTS SQUID microscope head with sharp permalloy rod for high spatial resolution [J].
Nagaishi, T ;
Minamimura, K ;
Itozaki, H .
IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2001, 11 (01) :226-229
[8]  
PITZIUS P, 1997, 6 INT SUP EL C ISEC, V3, P395
[9]   High-Tc SQUID microscope with sample chamber [J].
Tanaka, S ;
Yamazaki, O ;
Shimizu, R ;
Saito, Y .
SUPERCONDUCTOR SCIENCE & TECHNOLOGY, 1999, 12 (11) :809-812
[10]   Properties of high Tc superconducting quantum interference device microscope with high μ-metal needle [J].
Tanaka, S ;
Matsuda, K ;
Yamazaki, O ;
Natsume, M ;
Ota, H ;
Mizoguchi, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2001, 40 (5A) :L431-L433