Material Flaw Sizing By Ultrasonic Multipath Detection

被引:1
作者
Shen, Xizhong [1 ]
Li, Pan [1 ]
机构
[1] Shanghai Inst Technol, Elect & Automat Sch, Shanghai 201418, Peoples R China
来源
ADVANCES IN MANUFACTURING SCIENCE AND ENGINEERING, PTS 1-4 | 2013年 / 712-715卷
关键词
multipath; sizing; flaw; ultrasonic imaging;
D O I
10.4028/www.scientific.net/AMR.712-715.1067
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Sizing of material flaw is addressed in the multipath scene, and a method is developed to detect an isolated sized flaw and estimate its height based on imaging theory of different path profiles. A signal model based on the multipath higher order reflections of the flaw is built to detect the sized flaw. Multipaths are predicted and identified on the basis of the direct reflection path, which is relatively easy to be identified using the conventional flaw detection techniques. Direct reflection path and combined path are applied to detect the flaw from the top, and multipath 'w' is to detect its bottom of the flaw. Ultrasonic imaging is formed and synthesized by all the identified multipaths, which shows the size of the material flaw. Simulations and experimentations demonstrate that the flaw sizing can be calculated utilizing the time-of-arrivals of the multipath signals.
引用
收藏
页码:1067 / 1070
页数:4
相关论文
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[2]  
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[3]  
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