Electrical impedance tomography by elastic deformation

被引：127

作者：

Ammari, H. ^{[1
]}

Bonnetier, E. ^{[2
]}

Capdeboscq, Y. ^{[3
]}

Tanter, M. ^{[1
]}

Fink, M. ^{[1
]}

机构：

[1] ESPCI, CNRS, Lab Ondes & Acoust, UMR 7587, F-75231 Paris 05, France

[2] Univ Grenoble 1, Lab Modelisat & Calcul, F-38041 Grenoble 9, France

[3] Univ Versailles St Quentin, CNRS, LMV, Versailles, France

来源：

SIAM JOURNAL ON APPLIED MATHEMATICS | 2008年 / 68卷 / 06期

基金：

英国工程与自然科学研究理事会;

关键词：

electrical impedance tomography; elastic perturbation; asymptotic formula; reconstruction; substitution algorithm; 0-Laplacian;

D O I：

10.1137/070686408

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

This paper presents a new algorithm for conductivity imaging. Our idea is to extract more information about the conductivity distribution from data that have been enriched by coupling impedance electrical measurements to localized elastic perturbations. Using asymptotics of the fields in the presence of small volume inclusions, we relate the pointwise values of the energy density to the measured data through a nonlinear PDE. Our algorithm is based on this PDE and takes full advantage of the enriched data. We give numerical examples that illustrate the performance and the accuracy of our approach.

引用

页码：1557 / 1573

页数：17

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