Gallium desorption behavior at AlGaAs/GaAs heterointerfaces during high-temperature molecular beam epitaxy

被引:1
作者
Mahalingam, K
Dorsey, DL
Evans, KR
Venkat, R
机构
[1] USAF,WRIGHT LAB MLPO,MAT DIRECTORATE,WRIGHT PATTERSON AFB,OH 45433
[2] USAF,WRIGHT LAB AADP,AVION DIRECTORATE,WRIGHT PATTERSON AFB,OH 45433
[3] UNIV NEVADA,DEPT ELECT ENGN,LAS VEGAS,NV 89154
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1997年 / 15卷 / 04期
关键词
D O I
10.1116/1.589432
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A Monte Carlo simulation study is performed to investigate the Ga desorption behavior during AlGaAs-on-GaAs heterointerface formation by molecular beam epitaxy. The transients in the Ga desorption rate upon opening the Al shutter are shown to be associated with the concurrent reduction in the V/III flux ratio. Monte Carlo simulations employing a constant V/III flux ratio yield a ''steplike'' variation in the Ga desorption rate with the resulting interfaces closer in abruptness to the ideal AlGaAs-on-GaAs interface. Further details on the stoichiometry of the interface and its relationship with predicted Ga desorption profiles is presented. (C) 1997 American Vacuum Society.
引用
收藏
页码:1159 / 1162
页数:4
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