Recent NMR developments applied to organic-inorganic materials
被引:72
作者:
Bonhomme, Christian
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Univ Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, FranceUniv Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, France
Bonhomme, Christian
[1
]
Gervais, Christel
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Univ Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, FranceUniv Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, France
Gervais, Christel
[1
]
Laurencin, Danielle
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ENSCM, CNRS, Inst Charles Gerhardt Montpellier, UMR5253,UM2,UM1,CC1701, F-34095 Montpellier, FranceUniv Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, France
Laurencin, Danielle
[2
]
机构:
[1] Univ Paris 06, CNRS, Coll France, Lab Chim Mat Condensee Paris,UMR 7574, F-75231 Paris 05, France
[2] ENSCM, CNRS, Inst Charles Gerhardt Montpellier, UMR5253,UM2,UM1,CC1701, F-34095 Montpellier, France
In this contribution, the latest developments in solid state NMR are presented in the field of organic-inorganic (O/I) materials (or hybrid materials). Such materials involve mineral and organic (including polymeric and biological) components, and can exhibit complex O/I interfaces. Hybrids are currently a major topic of research in nanoscience, and solid state NMR is obviously a pertinent spectroscopic tool of investigation. Its versatility allows the detailed description of the structure and texture of such complex materials. The article is divided in two main parts: in the first one, recent NMR methodological/instrumental developments are presented in connection with hybrid materials. In the second part, an exhaustive overview of the major classes of O/I materials and their NMR characterization is presented. (C) 2013 Elsevier B.V. All rights reserved.
机构:
Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Adem, Ziad
;
Guenneau, Flavien
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Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Guenneau, Flavien
;
Springuel-Huet, Marie-Anne
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Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Springuel-Huet, Marie-Anne
;
Gedeon, Antoine
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Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
机构:
Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Adem, Ziad
;
Guenneau, Flavien
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h-index: 0
机构:
Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Guenneau, Flavien
;
Springuel-Huet, Marie-Anne
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h-index: 0
机构:
Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France
Springuel-Huet, Marie-Anne
;
Gedeon, Antoine
论文数: 0引用数: 0
h-index: 0
机构:
Univ Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, FranceUniv Paris 06, CNRS, UMR 7142, Lab Syst Interfaciaux Echelle Nanometr, F-75252 Paris 05, France